WebFISCHERSCOPE®X-RAY XDAL® The XDAL measurement systems with silicon PIN detec- tors and micro-focus tubes provide reliable analysis results and coating thickness readings even for small concentrations and thin coatings. They are used in incoming goods inspection, production monitoring and in research and development. WebThe FISCHERSCOPE X-RAY XDAL is used to determine Pb in tin-lead solder coatings. In this application, the thickness of the SnPb coating must be determined cor-rectly in order …

Available In-Stock FISCHERSCOPE DUALSCOPE FMP100

WebThe FISCHERSCOPE X-RAY 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. ... The XDAL instruments with … WebThe FISCHERSCOPE X-RAY XDAL has a large meas-urement chamber which accommodates specimens with complex geometries. The motor-driven, adjustable Z-axis allows for sample heights of up to 140 mm. For large, flat samples such as PC Boards, the housing has openings on the side (C-slot). fare nursery

X-ray fluorescence spectrometer FISCHERSCOPE® X-RAY XDAL®

WebfFISCHERSCOPE® X-RAY XDAL® 600 Exceptional large Silicon Drift Detector (20mm² standard / optional 50 mm², 0.08 in² effective detector area) and the large aperture (Ø3 mm, 118 mils) enables FISCHERSCOPE® X-RAY XDAL® 600 to achieve highest accuracy with a short measurement time. ∙ Application Analysis of very thin coatings of ≤ 0.05 μm … WebThe FISCHERSCOPE® X-RAY XDAL is an X-Ray spectrometer for quantitative materials analysis. Due to the broad range of detectable elements from Aluminum to Uranium, the array of applications for the … WebFISCHERSCOPE X-RAY XDAL-PCB In contrast to the XULM-PCB and XDLM-PCB, the FISCHERSCOPE® X-RAY XDAL®-PCB is equipped with a highly sensitive silicon drift detector (SDD), different apertures and filters. … correcting mla citations